Field Emission Scanning Electron Microscopy (FE SEM)
Thanks to the Image and Chemical Analysis Laboratory (ICAL) our lab has access to a Field Emission Scanning Electron Microscope. With this state-of-the-art instrument we are able to analyze the surface morphology of samples and investigate the cross sections of samples to determine coating thicknesses.
X-Ray Diffraction Spectrometer
The Image and Chemical Analysis Laboratory (ICAL) also gives our lab the opportunity to use X-Ray Diffraction, an analytical technique that is used to identify unknown crystalline materials. XRD is often used to determine which spinel phases are present in the oxide layers of
In our lab, a high power optical microscope enables fast analysis of surfaces and measurements of coating thicknesses using a computer interface.
Precision Cross Sectioning and Polishing
These in-lab instruments enable our lab to cut and polish samples for imaging. Our method aids in producing sharp, presentation grade images when samples are analyzed using optical and scanning electron microscopy.